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Review Published in JEOL News

Our review of data-guided microscopy is now published in JEOL News! We describe our work operationalizing artificial intelligence and machine learning to examine the behavior of functional nanomaterials.

From the abstract:

Many emerging technologies depend on the precise design of materials structure, chemistry, and defects. As devices shrink, manufacturing tolerances tighten, and performance envelopes improve, we must increasingly measure and manipulate materials at or near the single atom level. Here we describe how transmission electron microscopy (TEM) underpins our ability to see and direct the latent atomic world. We review a selection of our recent high-resolution TEM studies of the synthesis of oxide-based nanomaterials and their evolution in extreme environments. We then discuss powerful new artificial intelligence (AI) and machine learning (ML) approaches we have developed for rich, reproducible, and scalable experimentation. We conclude by discussing future developments that will enable new materials for breakthrough technologies.

Download the article from JEOL here: https://www.jeolusa.com/NEWS-EVENTS/JEOL-NEWS-Magazine

Steven S