FIG Perspective Published in Microscopy Today

Focused interest groups (FIGs) are advancing collaboration and breakthroughs through the Microscopy Society of America. In our perspective in Microscopy Today, we describe the history of the aberration-corrected electron microscopy and the emerging data science FIGs that are transforming the field.

From the article:

Over the past several decades, the science of electron microscopy (EM) has risen to become one of the cornerstone approaches to understanding material structure, chemistry, and defects at exceptional spatial resolution. This rise can be attributed to the hard work of researchers and companies who have pushed the bounds of instrumentation and analysis, but it is also the result of advocacy by members of professional societies. Such advocacy is exemplified by the Aberration Corrected EM (ACEM) focused interest group (FIG) of the Microscopy Society of America (MSA), which has played an important role in facilitating new hardware developments, promoting the exchange of ideas to catalyze discovery, and building the next generation of leaders in electron microscopy. From the early 2000s to the present, aberration correction has moved from proof-of-concept instrumentation to an established technique, providing unprecedented improvements in spatial and chemi- cal resolution for breakthroughs in chemistry, physics, and materials science.

Download it here: https://doi.org/10.1093/mictod/qaad042